The RAPID II is a highly versatile X-ray area detector in the history of materials analysis. The success of the RAPID II is mainly due to the suitability of imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials.
The instrument combines an exceptionally large active-area imaging plate that is sensitive to a wide range of radiation sources with the flexibility to match it with a large variety of X-ray sources and optics. The nature of the imaging plate detector implies that weak measurements can be made easily in the presence of strong measurements.
The detector integrates a well-proven, time-tested design with the lack of a need for calibration and the RAPID II is a detector that can be maintained in the field with a minimum of downtime.
Examples of experiments that can be done on the RAPID II include, phase ID of powder samples, micro-diffraction mapping down to 10 microns, diffuse scattering, fiber diffraction, small molecule structure analysis, stress and texture measurements, etc.
The product features of the RAPID II are:
- Curved imaging plate provides a large 210° aperture
- Long exposures allowed because of absence of dark current noise
- Large dynamic range achieved with dual photomultiplier design.
- No detector calibration required.
- Low maintenance—all components can be serviced on-site.
- Huge experimental versatility, from powders to single crystals.
- High sensitivity coupled with low readout noise.
- Imaging plate detector sensitive for all potential X-ray targets
- Multiple X-ray source options, from sealed tube to rotating anode generators