Non-Destructive Elemental Analysis: MIDEX M X-ray Fluorescence Spectrometer

The SPECTRO MIDEX is an X-ray fluorescence spectrometer designed for carrying out elemental analysis in research and industrial applications that demand sensitive, non-destructive technique, resulting in small measuring spots.

The spectrometer meets all these application requirements, including the analysis of the finest details of sample. Based on the customer's input, the applications of the spectrometer was further extended and optimized.

As a result, an ED-XRF spectrometer was developed which is easy to use and provides new standards for analytical performance.

The third-generation SPECTRO MIDEX ensures rapid and non-destructive analysis of small spots and allows fast mapping of large surfaces.

Key Features

The main features of the SPECTRO MIDEX are:

  • Non-destructive measuring technique
  • Easy to use
  • Fast and accurate results
  • Analysis of finest details of sample
  • Rapid mapping technique

Applications

The main applications of the SPECTRO MIDEX are:

  • Analysis of plastics
  • Analysis of lead in toys and precious metal alloys
  • Identification of plastic inclusions

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