Watch this webinar titled, 3D Crystallographic Tomography: A Revolutionary New Lab Technique to Image Grain Microstructure on-demand now.
About this webinar
In this webinar, two experts from the field of 3D X-ray microscopy and metals research respectively, will introduce the groundbreaking laboratory based non-destructive 3D crystallographic grain mapping technique called diffraction contrast tomography (DCT) and present compelling applications examples on a wide variety of materials.
Previously only accessible at the synchrotrons, this revolutionary technique is now within the reach of every academic and industrial researcher and can provide a deeper insight into the 3D crystallographic microstructure of samples ranging from metals and alloys, ceramic and geomaterials. New generation lab-based DCT now unlocks access to massive sample volumes, up to three orders of magnitude larger than traditional 3D-EBSD methods and delivers true sample representivity. Coupled with correlated microscopy workflows, lab-based DCT delivers the most comprehensive story of any polycrystalline sample.
Key learning objectives:
- How X-rays can be used for mapping crystallographic grain microstructure in 3D non-destructively in a home laboratory
- Significance of true sample representivity and how new non-destructive methods can address this critical challenge
- How the destructive and non-destructive approaches can be combined to gain unique insights into a materials science sample
- What future directions lab-based DCT and other grain mapping workflows hold for materials research?
About the event speakers
Andy Holwell manages the Business Sector Industrial Research at ZEISS Microscopy, encompassing the metals and materials industries for diverse markets from steel to electronic materials.
After graduating with MChem in Chemistry (University of York, UK), he has gained almost twenty years’ international experience the chemicals, catalysts, fuels, jewellery and metals sectors, in technical, analytical and commercial roles, including ten years with Johnson Matthey in precious metals and chemicals. He currently leads all ZEISS’s global strategic marketing, innovation and market education activities for advanced microscopy solutions in the metals and materials industries.
Dr. Hrishikesh Bale is the Market Solutions Manager managing Engineering Materials sub-sector at Carl Zeiss Microscopy Inc.. He specializes in new applications development for laboratory 3D X-ray imaging techniques both at micro and nano-scale. His research focus lies in the area of 3D diffraction contrast tomography and in-situ micro and nano-mechanical testing using X-ray computed tomography. He has a strong background in materials science and mechanical engineering, with over a decade of experience in synchrotron X-ray microscopy and tomography and finds great interest in pushing the boundaries of in-situ imaging under extreme service conditions and developing multi-modal nano and micro 3D imaging solutions.
Before joining Carl Zeiss Microscopy in 2014, he held a joint post-doctoral position at Lawrence Berkeley National Laboratory and UC Berkeley working as part of the National Hypersonics Science Center, imaging advanced CMC materials under in-situ high temperature conditions. He received his Ph.D. in Materials Science from Oklahoma State University in 2010 with a focus on Microscale Residual Stress determination using Synchrotron Laue Microdiffraction techniques.