Simultaneous Wavelength Dispersive XRF Spectrometer - Simultix 15

Simultix 15

The Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used around the world for over 40 years as an elemental analytical tool for process control in industries that require high throughput and precision, such as those that produce steel and cement. As technological advances continue to progress, industrial requirements for these purposes have also advanced and diversified.

To address these growing requirements, the Simultix 15 WDXRF elemental analyzer is a powerful analytical tool used that exhibits significantly improved performance, functions, and usability for elemental analysis.

XRF for Fast and Precise Elemental Analysis

The WDXRF tool is capable of analyzing elements ranging from beryllium (Be) to uranium (U) that are present in almost any sample matrix. With up to 30-40 discrete and optimized elemental channels and 3 kW or 4 kW of X-ray tube power, the Simultix 15 delivers an unparalleled analytical speed and sensitivity. Coupled to a powerful and user friendly software, the Simultix 15 offers extensive data reduction capabilities and maintenance functionality, thereby making this the perfect elemental analysis metrology tool.

Elemental Analysis by XRF with Full Automation

For high-throughput applications, automation is a fundamental requirement. Therefore, the Rigaku Simultix 15 WDXRF spectrometer can be fitted with a 48-position Automatic Sample Changer (ASC). For full automation, the optional Sample Loading Unit can provide right or left side belt-in feed from a third party sample preparation automation system.

Elemental Analysis by Simultaneous WXDRF

In contrast to the more common sequential WDXRF instrumentation that measures elements in a continuous manner using a scanning goniometer that is equipped with an analyzing crystal changer mechanism, the simultaneous WDXRF speeds up the measurement process. Each Rigaku Simultix 15 XRF spectrometer is customized for the specified elemental analysis applications in a given industry with a set of discrete, optimized and fixed channels for the elements to be analyzed.

All channels measure simultaneously, without the need of any moving parts, time delay or compromise by the user, thereby allowing this instrument to be the best solution in terms of time-to-result, precision, reliability, low cost-per-analysis and instrument longevity. For additional flexibility, the Simultix 15 wavelength dispersive X-ray fluorescence spectrometer may be optionally equipped with a scanning goniometer for the analysis of additional elements, as well as XRD channels for phase analysis.

Product Features

  • Synthetic multi-layers, RX-SERIES: New synthetic multi-layer crystal ”RX85” produces an intensity that is approximately 30% greater than existing multi-layers for Be-Ka and B-Ka.
  • XRD channel: Equipped with XRD channel, the Simultix 15 can utilize the quantitative analysis performed by XRF and XRD.
  • Doubly curved crystal: An optional double curved crystal can be equipped to fixed channel to allow for an increased intensity as compared with using a single curved crystal.
  • Improved software is easy to use: The Simultix 15 software has enhanced operability of quantitative condition setting by adopting a quantitative analysis flow bar that mimics that which is utilized in the ZSX software.
  • Heavy and light scanning goniometer: An optional wide elemental range goniometer supports standardless semi-quant (FP) and may also be used for qualitative or quantitative determination of non-routine element.
  • BG measurement for trace elements: An optional background measurement (BG) for a fixed channel can result in improved calibration fits and superior accuracy of the instrument.
  • Automatic Pressure Control (APC): An optional APC system maintains a constant vacuum level in the optical chamber to dramatically improve the precision of the light element analysis.
  • Quantitative scatter ratio method: While utilizing the Compton scattering ratio method for the analysis of ore(s) and concentrate(s), an optional quantitative scatter ratio method can be used to generate theoretical alphas for calibrating the scattering ratio.
  • Up to 40 fixed channels: The standard 30 fixed channel configuration can be upgraded to 40 channels upon request by the user.
  • Automation: An optional Sample Loading Unit provides a belt-in feed from a third party sample preparation automation system.

Specifications

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General
Technique X-ray fluorescence (XRF) spectroscopy
Type Wavelength dispersive (WD), simultaneous
Optics Tube above
Elemental coverage 4Be through 92U
X-ray generator
X-ray tube End window, Rh-anode, 4 kW, 60 kV (standard)
End window, Rh-anode, 3 kW, 60 kV (optional)
HV power supply High frequency inverter, ultra-high stability
Cooling Internal water-to-water heat exchanger
Spectrometer
Fixed channels Up to 30 (standard), up to 40 (optional)
Scanning goniometer Optional only with 30 channel configuration
Optics stabilization Controlled temperature: 36.5 °C
Sample changer 8 positions standard, 48 positions optional
Optical chamber APC automatic pressure controller
Maximum sample diameter 51.5 mm
Sample rotation speed 60 rpm
Vacuum system Direct coupled oil rotary pump (with mist catcher)
Atmosphere Vacuum or air
Detectors Scintillation counter (SC)
Sealed proportional counter (S-PC)
Flow proportional counter (F-PC)
Available options XRD channel
Computer
Type PC
Operating system Microsoft Windows
Printer Dot-Matrix type or Ink-Jet type

Simultaneous Wavelength Dispersive XRF Spectrometer - Simultix 15

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