Rigaku ZSX Primus III+ offers quick atomic determination of minor and major atomic elements from oxygen(O) to uranium (U), in a broad range of sample types with least standards.
ZSX Primus III+ features an innovative optics-above configuration. There is no need to worry about a contaminated beam path or down time because of sample chamber maintenance.
The high precision positioning of the sample ensures that the distance between the sample surface and X-ray tube is kept constant. This is significant for applications that require high accuracy, such as the analysis of alloys. ZSX Primus III+ performs high-precision analysis using an innovative optical configuration designed to reduce errors caused by non-flat surfaces in samples such as fused beads and pressed pellets.
EZ-scan helps users to study unknown samples without any previous setup. This is a time-saving feature that needs only a few clicks of the mouse and the entry of a sample name. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX can automatically correct all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased precision is achieved using matching library and perfect scan analysis programs.
The product features of the ZSX Primus III+ are:
- Analysis of elements from O to U
- Tube above optics reduces contamination issues
- Small footprint uses less valuable lab space
- High precision sample positioning
- Special optics reduce errors caused by curved sample surfaces
- Software tools for statistical process control (SPC)
- Evacuation and vacuum leak rates can be optimized for throughput